Wafer Macro Defects Detection and Classification
Defect detection is an integral part of wafer (chip) fabrication process. It enables defect detection and classification along the process to increase the fab yield (amount of good chips out of total wafers processed). Every detected defect is handled as an indicator of some process malfunction. ...
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Machine Vision Robots for Semiconductors
Robots have been used in the semiconductor industry for a long time. The functions of robots for semiconductors manufacturing operations are spawn over a wide range of tasks, from mechanical tasks up to intelligent tasks. The latter use machine vision. Defect detection in semiconductors manufactu...
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SEMICON West 2017
11-13 July in S. Francisco, CA
Connect with us and 250,000 electronics manufacturers. Call us and we’ll discuss your work. July 11-13 in S. Francisco, California Contact Us
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Visual Inspection of Semiconductors
Imprinting information on a silicon wafer is a complex multi-process task. In the wafer fabrication process, nanoimprinting process miniature patterns a coined on the wafer body using a variety of techniques (such as UV and thermal imprints). Defects can occur during the imprinting process, stemm...
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Wafer defect detection by feature matching
Detection of microscopic defect in wafers and printed circuit boards is a standard procedure in the manufacturing process and also a crucial step in quality assurance. The time consuming human inspection of circuit boards has been replaced in nearly all production lines with an automatic in-line ...
Read MoreVisual Inspection – Semiconductors
RSIP Vision's advanced semiconductor vision system thoroughly inspects each reticule, using image registration + model comparison to capture critical errors
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Industrial Vision Systems
RSIP Vision's nondestructive testing techniques provide a noninvasive means of detecting and examining a variety of production flaws
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